The book "Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching" provides a comprehensive introduction to the fundamentals and applications of supermicroscopy, particularly atomic force microscopy (AFM) and scanning nearfield optical microscopy (SNOM). It is aimed at professionals in the natural sciences, including physics, chemistry, mineralogy, materials science, biology, and medicine, as well as experts in the field of nanotechnology. The monograph discusses the differences between nano- and micro-mechanical testing and explains the challenges and solutions involved in examining rough and technical surfaces at the submicron level. Special attention is given to new instrumentation, physical laws, and innovative applications that are significant across various scientific disciplines. Additionally, common sources of error and their efficient resolution are addressed to facilitate the application of these principles to real scientific and industrial tasks.