The textbook "Noncontact Atomic Force Microscopy" by Franz J. Giessibl provides a comprehensive analysis of the advancements in non-contact atomic force microscopy (NC-AFM) since its first publication in 2002. It covers significant developments and results achieved with atomic resolution and highlights innovative technologies such as force spectroscopy, atomic manipulation, and magnetic exchange force microscopy. The book demonstrates how NC-AFM has become an indispensable tool in the fields of nanoscience and nanotechnology by enabling the characterization and manipulation of individual atoms, molecules, and nanostructures with atomic and subatomic resolution. The topics addressed are of great importance to researchers and professionals engaged with the latest developments in materials science and nanotechnology.