"Applied Scanning Probe Methods IX" is a specialized book that focuses on the characterization of material surfaces and molecular systems. It is part of a renowned book series that addresses advancements in scanning probe microscopy and its applications. This volume covers various techniques for structural and local mechanical characterization, encompassing a wide range of STM and AFM studies. The authors, including renowned experts such as Bharat Bhushan and Harald Fuchs, present current research findings and innovative approaches in materials science. The chapters are systematically organized and provide deep insights into the latest developments and applications in scanning probe microscopy. This book is aimed at professionals and students who wish to engage with the latest techniques and their practical applications in research and industry.