The book "Fault Diagnosis of Analog Integrated Circuits" provides a comprehensive introduction to the testing methods and troubleshooting of analog integrated circuits, which is relevant for both students and professionals in the electronics industry. In an era where system-on-chip (SoC) designs integrate both digital and analog circuits, the need for effective testing methods is becoming increasingly urgent. While digital testing methods are well established, testing analog circuits remains a challenge that requires extensive research due to the complexity of analog signals. This specialized book covers the fundamentals and advanced techniques for troubleshooting bipolar and MOS circuits and offers valuable insights into the development of test stimuli as well as experimental verifications of modern techniques. It is a valuable resource for anyone involved in the analysis and testing of analog circuits.