The book "Test and Design-for-Testability in Mixed-Signal Integrated Circuits" offers a comprehensive analysis of testing and design methods for analog and mixed-signal ICs. In an era where system-on-chip (SoC) technologies are becoming increasingly complex, testability is becoming a crucial factor for the success of integrated circuits. This specialized book is aimed at both professionals and students, presenting fundamental concepts as well as innovative approaches in an understandable manner. It highlights the challenges and solutions in the testability of heterogeneous systems and provides a valuable overview of the current state of research. The detailed treatment of various topics, including the use of DSP-based testing tools and standardization according to IEEE 1149.4, makes it an important resource for anyone involved in the development of complex ICs.